Statistics for Understanding the role of buried interface charges in a metal-oxide-semiconductor stack of Ti/Al2O3/Si using hard x-ray photoelectron spectroscopy
Total visits
| views | |
|---|---|
| Understanding the role of buried interface charges in a metal-oxide-semiconductor stack of Ti/Al2O3/Si using hard x-ray photoelectron spectroscopy | 2 |
Total visits per month
| views | |
|---|---|
| February 2024 | 0 |
| March 2024 | 0 |
| April 2024 | 1 |
| May 2024 | 0 |
| June 2024 | 1 |
| July 2024 | 0 |
| August 2024 | 0 |
File Visits
| views | |
|---|---|
| 1.4919448.pdf | 20 |