End to end testing and non-uniformity detection and correction of superlattice light emitting diodes infrared scene projectors
| Author(s) | Barakhshan, Peyman | |
| Date Accessioned | 2021-04-07T18:19:23Z | |
| Date Available | 2021-04-07T18:19:23Z | |
| Publication Date | 2020 | |
| SWORD Update | 2021-02-21T17:01:47Z | |
| Abstract | Infrared (IR) detectors are widely used in different industries, such as autonomous cars and the military. IR scene generators have been on demand for testing the guidance systems built with IR detectors. In 2014, the CVORG team at the University of Delaware built the world’s first IR LED (light-emitting diode) scene projector. This system is known as the SLEDS (super-lattice light-emitting diode systems) and has been thoroughly tested and evaluated at numerous user facilities. ☐ New and upgraded versions of the SLEDS projector have been developed, and the need for Testing and characterization of these systems has become more critical than ever. The goal of this research is to test all components in the system and characterize and fix the non-uniformity of the LEDs using the software. The most important part about the non-uniformity correction is to have a stable system, and therefore, understanding how each component works and behaves is crucial in achieving the goal of this paper. ☐ The following is the list of five original contributions to knowledge related to the SLEDS project: • 1. Control interface to monitor and test IR scene projectors. (Chapter 2) • 2. Study and automation of Non-uniformity detection of IR LED arrays. (Chapter 3) • 3. Study and automation of Non-uniformity correction of IR LED arrays. (Chapter 5) • 4. Rise time calculation of IR LED scene projectors. (Chapter 3) • 5. Study and testing the behavior of IR LED arrays. (Chapters 3–5) | en_US |
| Advisor | Kiamilev, Fouad E. | |
| Degree | Ph.D. | |
| Department | University of Delaware, Department of Electrical and Computer Engineering | |
| DOI | https://doi.org/10.58088/q0vc-j932 | |
| Unique Identifier | 1245423574 | |
| URL | https://udspace.udel.edu/handle/19716/28877 | |
| Language | en | |
| Publisher | University of Delaware | en_US |
| URI | https://login.udel.idm.oclc.org/login?url=https://www.proquest.com/dissertations-theses/end-testing-non-uniformity-detection-correction/docview/2501508265/se-2?accountid=10457 | |
| Keywords | Infrared scene projection | en_US |
| Keywords | Infrared light emitting diode scene projector | en_US |
| Keywords | Non-uniformity correction | en_US |
| Keywords | Projector's innovative, networked graphical user interface | en_US |
| Title | End to end testing and non-uniformity detection and correction of superlattice light emitting diodes infrared scene projectors | en_US |
| Type | Thesis | en_US |