Mirror-plane disorder in a nickel chloride Schiff base com­plex: a suitable case study for crystallographic instruction

Author(s)Hsuan, Chang
Author(s)Chen, Wen-Ching
Author(s)Shen, Jiun-Shian
Author(s)Ong, Tiow-Gan
Author(s)Wang, Vincent C.-C.
Author(s)Yap, Glenn P. A.
Date Accessioned2022-05-04T20:44:23Z
Date Available2022-05-04T20:44:23Z
Publication Date2022-01-27
DescriptionThis article was originally published in Acta Crystallographica Section C: Structural Chemistry. The version of record is available at: https://doi.org/10.1107/S2053229622000973en_US
AbstractThe nickel chloride complex of the Schiff base N2,N20-propanediylbis(2,3-butanedione-2-imine-3-oxime), namely, chlorido(3,9-dimethylundeca-3,8-diene-2,10-dione 10-oxime 2-oximato- 4N,N0,N00,N000)nickel(II), [NiCl(C 11 H19 N4 O2 )], at 100 K crystallizes in the orthorhombic space group Cmce. The structure exhibits mirror disorder of the main molecule that is not present in the bromide analogue. The relatively small number of unique reflections in the data set and the disorder imposed by the crystallographic mirror plane present a challenging educational case study.en_US
SponsorFunding for this research was provided by: Ministry of Science and Technology, Taiwan (contract No. 110-2636-M-110-006 to VCCW).en_US
CitationChang, Hsuan, Wen-Ching Chen, Jiun-Shian Shen, Tiow-Gan Ong, Vincent C.-C. Wang, and Glenn P. A. Yap. “Mirror-Plane Disorder in a Nickel Chloride Schiff Base Complex: A Suitable Case Study for Crystallographic Instruction.” Acta Crystallographica Section C Structural Chemistry 78, no. 3 (March 1, 2022): 137–40. https://doi.org/10.1107/S2053229622000973.en_US
ISSN2053-2296
URLhttps://udspace.udel.edu/handle/19716/30843
Languageen_USen_US
PublisherActa Crystallographica Section C: Structural Chemistryen_US
KeywordsSchiff baseen_US
Keywordsnickel complexen_US
Keywordscase studyen_US
Keywordsdisorderen_US
Keywordsoximeen_US
Keywordscrystal structureen_US
TitleMirror-plane disorder in a nickel chloride Schiff base com­plex: a suitable case study for crystallographic instructionen_US
TypeArticleen_US
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