Design and development of a 512x512 infrared emitter array system

Date
2011
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University of Delaware
Abstract
The detection of infrared (IR) light has a multitude of applications, ranging from commercial to military. Arrays that are built to detect IR light can be very difficult to accurately test and characterize without a frame of reference. A large IR projection system can be used to provide the reference needed to accurately calibrate an IR detector. As the size of the detection arrays grows, so to does the requirement for IR projection arrays. The following paper is a description of the work completed to create a full system for driving, characterizing, and testing a 512x512 array of super-latticed LEDs (SLEDS) at cryogenic temperatures. The main components of this system include a driver integrated circuit, a custom cryogenic package, and various top level components. In addition, future work for this generation and future generations of the SLEDS project are discussed. Preliminary results have shown that the driver integrated circuit is capable of driving multiple loads with currents in excess of 20mA per pixel, at room temperature. The included monitoring capabilities will allow for more precise testing of the system, and allow us to examine the functionality of individual pixels anywhere on the array. That, plus the addition of the test pins, will give us unprecedented test results of the driver functionality.
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