Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X‑ray Photoelectron Spectroscopy Depth Profiling
| Author(s) | Gilbert, Jonathan B. | |
| Author(s) | Luo, Ming | |
| Author(s) | Shelton, Cameron K. | |
| Author(s) | Rubner, Michael F. | |
| Author(s) | Cohen, Robert E. | |
| Author(s) | Epps, Thomas H. III | |
| Ordered Author | Jonathan B. Gilbert, Ming Luo, Cameron K. Shelton, Michael F. Rubner, Robert E. Cohen, and Thomas H. Epps, III | |
| UD Author | Shelton, Cameron K. | en_US |
| UD Author | Epps, Thomas H. III | en_US |
| UD Author | Luo, Ming | |
| Date Accessioned | 2015-12-16T16:45:15Z | |
| Date Available | 2015-12-16T16:45:15Z | |
| Copyright Date | Copyright © 2014 American Chemical Society | en_US |
| Publication Date | 2014-12-19 | |
| Description | Publisher's PDF. | en_US |
| Abstract | X-ray photoelectron spectroscopy (XPS) depth profiling with C60 þ sputtering was used to resolve the lithium-ion distribution in the nanometer-scale domain structures of block polymer electrolyte thin films. The electrolytes of interest are mixtures of lithium trifluoromethanesulfonate and lamellar-forming polystyrene poly(oligo(oxyethylene)methacrylate) (PS POEM) copolymer. XPS depth profiling results showed that the lithium-ion concentration was directly correlated with the POEM concentration. Furthermore, chemical state and atomic composition of the film were analyzed through the deconvolution of the C1s signal, indicating that the lithium ions appear to be uniformly distributed in the POEM domains. Overall, the unique capabilities of C60 þ depth profiling XPS provide a powerful tool for the analysis of nanostructured polymer thin films in applications ranging from energy storage and generation to surface coatings and nanoscale templates. | en_US |
| Department | University of Delaware. Department of Chemical & Biomolecular Engineering. | en_US |
| Citation | Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling. - ACS Nano. (- 1):- 512. | en_US |
| DOI | doi:10.1021/nn505744r | en_US |
| ISSN | 1936-0851 ; e-1936-086X | en_US |
| URL | http://udspace.udel.edu/handle/19716/17322 | |
| Language | en_US | en_US |
| Publisher | American Chemical Society | en_US |
| dc.rights | ACS AuthorChoice - This is an open access article published under an ACS AuthorChoice License, which permits copying and redistribution of the article or any adaptations for non-commercial purposes. | en_US |
| dc.source | ACS Nano | en_US |
| dc.source.uri | http://pubs.acs.org/journal/ancac3 | en_US |
| Title | Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X‑ray Photoelectron Spectroscopy Depth Profiling | en_US |
| Type | Article | en_US |
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