Hernandez-Raya, Miguel Angel2021-08-032021-08-032020https://udspace.udel.edu/handle/19716/29084The role an infrared scene projector (IRSP) plays in the qualication of infrared (IR) detection systems is to provide realistic simulated scenarios in a lab setting. As IR sensors become ever increasingly complex, there comes a critical need for projec- tion technologies to provide a means of testing. This method of hardware in the loop (HWIL) implementation reduces the cost and time of development. As a result, research and development (R&D) groups in industry and the military have a large interest in IRSP technologies. The IRSP technology to be discussed uses light emitting diodes (LED) to produce mid-wave infrared (MWIR) signatures. Going forward, IRSP systems need even higher resolutions coincident with increased projection speeds. A new read-in integrated circuit (RIIC) architecture is necessary to push this technology forward towards these higher resolutions. Using various very-large scale integration (VLSI) techniques, the new RIIC architecture is designed to be modular and scalable for emitters with dierent characteristics. The new RIIC architecture has be designed using the ONC18 process from OnSemiconductor. The base pixel has been made 4X smaller than the current state of the art RIICs for LED-based IRSPs. The principal reason for exploring a smaller pitch has been to test the theory of better light ex- traction from the Super-lattice LED (SLED) arrays. The SLED pixel is grown on a gallium-antimonide (GaSb) wafer using a cascade approach that increases aggregate light output. The RIIC pixel has been characterized using a testing platform that provides the digital patterns needed to drive the static logic, and the IV characteris- tics of every pixel were collected using a Keithley 24XX meter. The SLED pixel has been characterized using an indium-antimonide (InSb) detector. LIV curves have been generated to compare variable size parts. Hybridization of the prototype part has not been performed, however, controlling the SLED pixel with the RIIC pixel has been demonstrated. LIV curves for these experiments were collected via the Keithley meter in conjunction with a forward-looking-infrared (FLIR) 6800 camera.Mid-wave infrared signaturesProjectionRead-in integrated circuitsSuper-lattice LEDLight emitting diodesInfrared sensor testingMethod of hardware in the loopResolutionProjection speedVery-large scale integrationModularScalableThesis1262648399https://doi.org/10.58088/0dtz-0a962021-05-11en