Data collection and analysis of read-in integrated circuits designed to drive arrays of infrared light emitting diodes using a scalable and modular testing platform for infrared scene projectors

dc.contributor.authorHernandez, Miguel A.
dc.date.accessioned2020-11-12T14:52:30Z
dc.date.available2020-11-12T14:52:30Z
dc.date.issued2016
dc.date.updated2020-05-23T16:01:04Z
dc.description.abstractThe read-in integrated circuit (RIIC) is an integrated circuit that drives an array of infrared emitters inside of an infrared scene projector (IRSP) system. We have designed different RIICs for four future IRSP systems that are being built by our research group. This paper describes a single scalable testing platform (STP) capable of testing all of our RIICs. This approach reduces the design time and risk associated with RIIC testing. On the hardware side, our platform consists of several custom printed circuit boards. On the software side, our platform consists of a single code base. After gathering data from a RIIC using the testing platform, the data is analyzed to determine the efficiency of such RIIC, and collect statistical data to aid the development of future RIICs.en_US
dc.description.advisorKiamilev, Fouad E.
dc.description.degreeM.S.
dc.description.departmentUniversity of Delaware, Department of Electrical and Computer Engineering
dc.identifier.doihttps://doi.org/10.58088/a926-2p38
dc.identifier.unique1204656265
dc.identifier.urihttps://udspace.udel.edu/handle/19716/27971
dc.language.rfc3066en
dc.publisherUniversity of Delawareen_US
dc.relation.urihttps://login.udel.idm.oclc.org/login?url=https://www.proquest.com/docview/2451879749?accountid=10457
dc.subjectInfrareden_US
dc.subjectProjectoren_US
dc.subjectRead-in integrated circuiten_US
dc.subjectRIICen_US
dc.subjectSingle scalable testing platform
dc.titleData collection and analysis of read-in integrated circuits designed to drive arrays of infrared light emitting diodes using a scalable and modular testing platform for infrared scene projectorsen_US
dc.typeThesisen_US

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