Data collection and analysis of read-in integrated circuits designed to drive arrays of infrared light emitting diodes using a scalable and modular testing platform for infrared scene projectors
Date
2016
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
University of Delaware
Abstract
The read-in integrated circuit (RIIC) is an integrated circuit that drives an array
of infrared emitters inside of an infrared scene projector (IRSP) system. We have
designed different RIICs for four future IRSP systems that are being built by our
research group. This paper describes a single scalable testing platform (STP) capable
of testing all of our RIICs. This approach reduces the design time and risk associated
with RIIC testing. On the hardware side, our platform consists of several custom
printed circuit boards. On the software side, our platform consists of a single code
base. After gathering data from a RIIC using the testing platform, the data is analyzed
to determine the efficiency of such RIIC, and collect statistical data to aid the
development of future RIICs.
Description
Keywords
Infrared, Projector, Read-in integrated circuit, RIIC, Single scalable testing platform